GE DXR500L Static Digital Detector Array

Utilizing Endurance scintillator technology, the DXR500L static digital detector array is able to provide the premium image quality of a CsI detector without the typical lag limitations of CsI. Designed for industrial use, the DXR500L provides the highest image quality in a rugged production environment. The DXR500L allows for easy detection of subtle indications. Utilizing Endurance™ technology, developed specifically to reduce radiation wear out and to maximize cost savings. GE’s detectors incorporate a temperature controller, allowing for longer calibration intervals and quick, consistent images. DXR500L provides application results efficiently with a cycle time reduction.

Key Features & Benefits

  • High-resolution images for easy detection of subtle indications
  • Endurance™ scintillator technology for optimal image quality and lag
  • Temperature controlled for stable offsets over longer periods, enabling more consistent imaging and fewer calibrations

Detector Characterization Charts

The detector characterization charts provided below are completed in accordance to ASTM E2597-07 Standard Practice for the Manufacturing Characterization of Digital Detector Arrays. This standard allows for the direct comparison of DDAs by ensuring data is collected and reported in a consistent and specified manner. The standard also enables guidance for the appropriate pairings of detectors with applications.

Pixels are identified as bad per one or more of the seven definitions described in the ASTM E2597-07 document. The pixels marked as bad will be corrected through GE’s software utilizing data collected from good neighborhood pixels.


  • Aerospace investment castings
  • Industrial gas turbine investment castings
  • Wax and ceramic patterns
  • Metrology
  • Materials science/geology
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